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UPCOMING EVENTS
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| 09.09.2010 | DO-178B Level A Programming Environment Details ------------------------------------------ | All Events
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Event
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| Event: | Don't Crash at the Finish Line | | Content: |
Don't Crash
at the Finish Line
Overcome skyrocketing embedded
device complexity to deliver products
on time and on quality |


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March 25, 2010
10 a.m. PT/1 p.m. ET/6 p.m. GMT |
Unable to attend the live webcast? Don't worry; register and we will send you the link to the recording. |
Across the embedded industry, product development executives are facing growing challenges with device software quality. Exponential increases in software content and device complexity are outpacing the capabilities of existing testing tools and methods.
More product teams are experiencing late-cycle quality surprises that cause them to crash at the finish line, with major schedule delays or defective product deliveries.
Without better insight into true device software quality, product development executives are making ill-informed decisions that can put their companies at risk. Leaders are increasingly uneasy and are looking for a game changer.
Now they have an answer.
Device software market leader, Wind River, presents a new solution for intelligent device testing that lets teams focus their efforts on what really needs testing. |
| | Date: | 25.03.2010 | |
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NEW PRODUCTS
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